We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Photoelectron Spectrometer.
ipros is IPROS GMS ・ IPROS One of the largest technical database sites in Japan that collects information on.

Photoelectron Spectrometer - List of Manufacturers, Suppliers, Companies and Products | IPROS GMS

Photoelectron Spectrometer Product List

1～3 item / All 3 items

Displayed results
[Analysis Case] Evaluation of Binding States in Secondary Battery Cathodes

[Analysis Case] Evaluation of Binding States in Secondary Battery Cathodes

You can evaluate the sample in its original state, from the binder and coating to the active substance.

Our organization conducts evaluations of the bonding state of cathodes in secondary batteries. X-ray photoelectron spectroscopy (XPS), which is one of the methods for analyzing surface states, is suitable for evaluating binders and conductive additives due to its shallow detection depth (approximately 10 nm). Hard X-ray photoelectron spectroscopy (HAXPES), which uses hard X-rays (Ga rays) for excitation, allows us to obtain information about active materials buried under binders without causing damage, thanks to its deeper detection depth. 【Measurement and Processing Methods】 ■ [XPS] X-ray Photoelectron Spectroscopy ■ [HAXPES] Hard X-ray Photoelectron Spectroscopy ■ Processing under controlled atmosphere *For more details, please download the PDF or feel free to contact us.

  • 1.png
  • 2.png
  • Contract Analysis
  • Photoelectron Spectrometer

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
JPS-9030 Photoelectron Spectroscopy Device (XPS)

JPS-9030 Photoelectron Spectroscopy Device (XPS)

Something that everyone can easily use right away.

Japan Electronics Co., Ltd. JPS-9030 Photoelectron Spectroscopy System (XPS) adopts a newly designed user interface that can be operated in a Japanese environment, achieving "anyone can easily and immediately use it." In addition, it comes standard with a Kaufman-type etching ion source and twin anodes, and while being a general-purpose XPS, it also has a wide range of expandability, including a high-temperature heating system and gas cluster ion source. 〇 Features - Depth profiling (depth direction analysis) that accommodates a wide range of purposes from nm to μm - Newly developed software focused on ease of use - Ultra-high sensitivity comparable to high-end models - Abundant options *For more details, please download the PDF or feel free to contact us.

  • Analytical Equipment and Devices
  • Photoelectron Spectrometer

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Evaluation of surface oxide film thickness using photoelectron spectroscopy.

Evaluation of surface oxide film thickness using photoelectron spectroscopy.

Calculate the oxide film thickness of the SiO2 surface oxide film on the Si substrate using photoelectron spectroscopy!

In the process of forming an oxide film, controlling the thickness of the oxide film is one of the very important factors. Therefore, we estimated the thickness of the surface oxide film non-destructively using photoelectron spectroscopy. In samples covered with a thin oxide film, many elemental photoelectron peaks show a two-peak structure corresponding to the oxide component and the substrate component. By measuring the spectral intensity of each component, we can estimate the thickness of the oxide film. There are several analytical methods to determine film thickness non-destructively, but compared to other methods, the ability to estimate the thickness at specific locations is a characteristic of this method. *For more detailed information, please refer to the attached PDF document. For further inquiries, feel free to contact us.*

  • Other analysis and evaluation services
  • Photoelectron Spectrometer

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Related Categories of Photoelectron Spectrometer

COPYRIGHT © 2001-2026 IPROS CORPORATION ALL RIGHTS RESERVED.